William D. Nix
Active 1965–2016
- 60
- Papers
- 40,783
- Citations
- 60
- h-index
- 60
- i10-index
Citations
Citation sources
Countries
Institutions
Fields
- Engineering61.5%
- Materials Science23.8%
- Physics and Astronomy3.2%
- Biochemistry, Genetics and Molecular Biology1.9%
- Medicine1.9%
- Dentistry1.9%
- Other5.8%
Topics
- Metal and Thin Film Mechanics8.2%
- Advancements in Battery Materials6.6%
- Microstructure and mechanical properties5.7%
- Advanced Battery Materials and Technologies4.4%
- Force Microscopy Techniques and Applications3.1%
- Supercapacitor Materials and Fabrication2.9%
- Other69.1%
Coauthors
- Yi Cui8
- Huajian Gao7
- Matthew T. McDowell6
- Seok Woo Lee5
- Ill Ryu4
- Joost J. Vlassak4
- Julia R. Greer4
- M. Doerner3
- Y. Huang3
- A. Bhattacharya2
- C. Norman Ahlquist2
- C. R. Barrett2
- Chongmin Wang2
- D. M. Barnett2
- Dah-Bin Kao2
- Donald S. Gardner2
- Erica T. Lilleodden2
- Gang Feng2
- Hui Wu2
- J.P. McVittie2
- Jang Wook Choi2
- Krishna C. Saraswat2
- Lucas A. Berla2
- Merrilea J. Mayo2
All papers
- What is the Young's Modulus of Silicon?
Authors: Matthew A. Hopcroft, William D. Nix, Thomas W. Kenny - Journal of Microelectromechanical Systems 2010 cited by 2,046
- Indentation size effects in crystalline materials: A law for strain gradient plasticity
Authors: William D. Nix, Huajian Gao - Journal of the Mechanics and Physics of Solids 1998 cited by 4,331
- Size dependence of mechanical properties of gold at the micron scale in the absence of strain gradients
Authors: Julia R. Greer, W. C. Oliver, William D. Nix - Acta Materialia 2005 cited by 1,498
- Effects of the substrate on the determination of thin film mechanical properties by nanoindentation
Authors: Ranjana Saha, William D. Nix - Acta Materialia 2002 cited by 1,546
- Mechanism-based strain gradient plasticity— I. Theory
Authors: Huajian Gao, Y. Huang, William D. Nix, John W. Hutchinson - Journal of the Mechanics and Physics of Solids 1999 cited by 2,226
- Size-dependent fracture of Si nanowire battery anodes
Authors: Ill Ryu, Jang Wook Choi, Yi Cui, William D. Nix - Journal of the Mechanics and Physics of Solids 2011 cited by 421
- A method for interpreting the data from depth-sensing indentation instruments
Authors: M. Doerner, William D. Nix - Journal of materials research/Pratt's guide to venture capital sources 1986 cited by 2,815
- Sample Dimensions Influence Strength and Crystal Plasticity
Authors: Michael D. Uchic, Dennis M. Dimiduk, J.N. Florando, William D. Nix - Science 2004 cited by 2,315
- Interconnected Silicon Hollow Nanospheres for Lithium-Ion Battery Anodes with Long Cycle Life
Authors: Yan Yao, Matthew T. McDowell, Ill Ryu, Hui Wu, Nian Liu, Liangbing Hu, William D. Nix, Yi Cui - Nano Letters 2011 cited by 1,443
- Nanoscale gold pillars strengthened through dislocation starvation
Authors: Julia R. Greer, William D. Nix - Physical Review B 2006 cited by 920
- A new bulge test technique for the determination of Young's modulus and Poisson's ratio of thin films
Authors: Joost J. Vlassak, William D. Nix - Journal of materials research/Pratt's guide to venture capital sources 1992 cited by 698
- Studying the Kinetics of Crystalline Silicon Nanoparticle Lithiation with In Situ Transmission Electron Microscopy
Authors: Matthew T. McDowell, Ill Ryu, Seok Woo Lee, Chongmin Wang, William D. Nix, Yi Cui - Advanced Materials 2012 cited by 623
- Analysis of elastic and plastic deformation associated with indentation testing of thin films on substrates
Authors: A. Bhattacharya, William D. Nix - International Journal of Solids and Structures 1988 cited by 538
- A micro-indentation study of superplasticity in Pb, Sn, and Sn-38 wt% Pb
Authors: Merrilea J. Mayo, William D. Nix - Acta Metallurgica 1988 cited by 439
- Finite element simulation of indentation experiments
Authors: A. Bhattacharya, William D. Nix - International Journal of Solids and Structures 1988 cited by 345
- Analysis of the accuracy of the bulge test in determining the mechanical properties of thin films
Authors: Martha Small, William D. Nix - Journal of materials research/Pratt's guide to venture capital sources 1992 cited by 292
- Mechanism-based strain gradient crystal plasticity—I. Theory
Authors: Chung‐Souk Han, Huajian Gao, Yonggang Huang, William D. Nix - Journal of the Mechanics and Physics of Solids 2004 cited by 283
- Formation of chiral branched nanowires by the Eshelby Twist
Authors: Jia Zhu, Hailin Peng, A. F. Marshall, D. M. Barnett, William D. Nix, Yi Cui - Nature Nanotechnology 2008 cited by 247
- Two-dimensional thermal oxidation of silicon—I. Experiments
Authors: Dah-Bin Kao, J.P. McVittie, William D. Nix, Krishna C. Saraswat - IEEE Transactions on Electron Devices 1987 cited by 207
- Mechanical properties of thin films
Authors: William D. Nix - Metallurgical Transactions A 1989 cited by 2,532
- 25th Anniversary Article: Understanding the Lithiation of Silicon and Other Alloying Anodes for Lithium‐Ion Batteries
Authors: Matthew T. McDowell, Seok Woo Lee, William D. Nix, Yi Cui - Advanced Materials 2013 cited by 1,630
- In Situ TEM of Two-Phase Lithiation of Amorphous Silicon Nanospheres
Authors: Matthew T. McDowell, Seok Woo Lee, Justin T. Harris, Brian A. Korgel, Chongmin Wang, William D. Nix, Yi Cui - Nano Letters 2013 cited by 856
- Determination of indenter tip geometry and indentation contact area for depth-sensing indentation experiments
Authors: K. W. McElhaney, Joost J. Vlassak, William D. Nix - Journal of materials research/Pratt's guide to venture capital sources 1998 cited by 817
- Crystallite coalescence: A mechanism for intrinsic tensile stresses in thin films
Authors: William D. Nix, B Clemens - Journal of materials research/Pratt's guide to venture capital sources 1999 cited by 650
