Analysis of the Equivalences and Dominances of Transient Faults at the RT Level

Authors: L. Berrojo, I. Gonzalez, Luis Entrena, C. López, Fulvio Corno, M. Sonza, Giovanni Squillero - Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) 2002 cited by 2

This work presents a study for tackling transient faults at the RT-level and outlines the techniques devised and implemented to speed-up fault-injection campaigns, detecting the equivalences and dominances between faults in order to collapse them. Experimental results are provided on an industrial case study, demonstrating the effectiveness of the approach.