Heavy Ion Testing and Single Event Upset Rate Prediction Considerations for a DICE Flip-Flop

Authors: Kevin M. Warren, A. Sternberg, Jeffrey D. Black, Robert A. Weller, Robert A. Reed, Marcus H. Mendenhall, Ronald D. Schrimpf, L. W. Massengill - IEEE Transactions on Nuclear Science 2009 cited by 51

Monte-Carlo simulation using the MRED software suite, coupled with SPICE analysis, is used to identify internal mechanisms of SEU in DICE flip-flops. Low frequency cross-section measurements and simulations identify multiple-node charge collection SEU mechanisms as the dominant contributor. An increasingly isotropic response is predicted with increasing frequency due to latching of internal single-node transients near clock boundaries. Implications for heavy ion testing and SEU rate prediction are presented.