Integrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened Circuitry

著者: Kevin M. Warren, A. Sternberg, Robert A. Weller, M.P. Baze, Lloyd W. Massengill, Robert A. Reed, Marcus H. Mendenhall, Ronald D. Schrimpf - IEEE Transactions on Nuclear Science 2008 被引用: 53

Monte-Carlo radiation transport code is coupled with SPICE circuit level simulation to identify regions of single event upset vulnerability in an SEU hardened flip-flop, as well as predict single event upset cross sections and on-orbit soft error rates under static and dynamic operating conditions.